CVE-2024-53017
What it is
Memory corruption while handling test pattern generator IOCTL command.
At a glance
- Exploitability
- Can be exploited locally on the machine with a low-privilege account. High risk of data tampering.
- Exploit odds
- 0.1% chance of exploitation in the next 30 days (EPSS).
- Fix
- A patch, advisory or fixed version is referenced. Upgrade or apply it.
Timeline
- PublishedDisclosed publicly on CVE.org and NVD
- Last updatedMost recent change to the record
Details
- Published
- Last modified
- Exploit probability
- 0.1% · EPSS, next 30 days
- Weakness
- CWE-823
- Record status
- Analyzed
Affected
- Qualcomm sdm429w Firmware
- Qualcomm Snapdragon 429 Mobile Platform Firmware
- Qualcomm wcn3620 Firmware
- Qualcomm wcn3660b Firmware
Attack profile CVSS 3.1 · 6.6
- Attack vector
- Local
- Complexity
- Low
- Privileges needed
- Low
- User interaction
- None
- Scope
- Unchanged
- Confidentiality
- Low
- Integrity
- High
- Availability
- Low
Raw vector
CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:L/I:H/A:L
